X-ray examination apparatus with a semiconductor x-ray detector
AssigneeU.S. Philips Corporation
InventorsWalter Rutten, Ulrich Schiebel, Herfried Wieczorek, Norbert Conrads
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Abstract
An x-ray examination apparatus includes an x-ray source for emitting x-rays and an x-ray detector for deriving an image signal from an x-ray image. The x-ray detector has a semiconductor element including one or several sensor elements. Further the x-ray examination apparatus is provided with a bias radiation source for irradiating the x-ray detector with electromagnetic radiation. In particular, the x-ray detector is an x-ray sensor matrix having a multitude of semiconductor sensor elements. Preferably the bias radiation source is arranged to emit infrared radiation.
Claims24
An x-ray examination apparatus comprising
- an x-ray source for emitting x-rays for forming an x-ray image, and
- an x-ray detector for deriving an image signal from the x-ray image, said x-ray detector comprising
- a semiconductor element for generating electric charges caused by x-rays from the x-ray source, and
- a bias radiation source for irradiating the semiconductor element with electromagnetic radiation of an energy less than the bandgap energy of the semiconductor element.
An x-ray examination apparatus comprising
- an x-ray source for emitting x-rays for forming an x-ray image,
- an x-ray detector for deriving an image signal from the x-ray image, said x-ray detector comprising
- a semiconductor element for generating electric charges caused by x-rays from the x-ray source, and
- a bias radiation source for irradiating the semiconductor element with electromagnetic radiation, and
- a control unit for controlling the x-ray source and the x-ray detector, which control unit is arranged to pulse the bias radiation source, subsequently carry-off electric charges from the semiconductor element, and after that energize the x-ray source.
A method for deriving an image signal from an x-ray image by way of an x-ray sensor matrix comprising a plurality of semiconductor sensor elements, the method comprising the steps of:
- irradiating the semiconductor sensor elements with electromagnetic bias radiation, and
- carrying-off electric charges from the semiconductor sensor elements and subsequently,
- converting an x-ray image into electric charges in the respective semiconductor sensor elements, and
- reading-out the electric charges from the semiconductor sensor elements so as to form the image signal.
Dependencies are inferred from the claim text.