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US 5,903,143 AGranted
Probe apparatus with RC circuit connected between ground and a guard
AssigneeHewlett-Packard Company
InventorsKohei Mochizuki, Satoshi Habu
Life of this patent
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Abstract
This invention is an inexpensive probe apparatus operating at high precision that can be used for both low-frequency and high-frequency measurements. A line with a first and second conductor is extended from a probe connected to a circuit component. A low-frequency or high-frequency device is alternately connected to the line. A third common conductor runs parallel to the aforementioned line and a resistor and capacitor is connected between the probe end of the aforementioned second conductor and the aforementioned common conductor.
Claims2
A probe apparatus comprising:
- an insulating substrate;
- an annular conductor positioned on said insulating substrate, said annular conductor exhibiting an open center area;
- a common conductor connecting said annular conductor to a ground potential;
- a plurality of signal lines extending into said open center area, each said signal line comprising a first conductor and a second conductor, each said first conductor being a signal carrying conductor and each said second conductor being a guard conductor, a series-connected resistor-capacitor circuit connected between a second conductor of each signal line and said annular conductor;
- and
- circuit component measuring probes connected to said first conductors of said signal lines for contacting a device under test.
3 more elements
Dependencies are inferred from the claim text.