Method for correcting a high frequency measurement error
AssigneeElectronics and Telecommunications Research Institute
InventorsChang Seok Lee, Ingab Hwang, Min Gun Kim, Jae Jin Lee, Kwang Eui Pyun
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AssigneeElectronics and Telecommunications Research Institute
InventorsChang Seok Lee, Ingab Hwang, Min Gun Kim, Jae Jin Lee, Kwang Eui Pyun
Estimating the term…
A method for correcting a high frequency measurement error which can exactly correct the high frequency measurement error even with the use of a standard devices of which characteristic have not been verified by calculating the characteristic impedance of the correction device from the characteristics of an auxiliary measuring device calculated by using a general error correction method, and calculating again the once calculated characteristics of the auxiliary measuring device. The method in accordance with the present invention comprises the steps of modelling an auxiliary measuring device used for measuring a high frequency charateristics of the device under test by two transmission lines connected in series between two terminals and a parasitic component connected in parallel between a junction of the two transmission lines and a ground; and moving a reference measurement point to the junction of the two transmission lines by using a phase angle of each transmission line and calculating a reference impedance at the terminal of the auxiliary measuring device to which an object to be measured is connected by using the difference of the resultant reflection coefficients of each port.
A method of correcting a high frequency measurement error associated with the high frequency measurement of an object by a measuring device, the object and measuring device each having a terminal connected thereto and having an interconnection device connected therebetween, said method comprising the steps of:
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