Field effect devices and capacitors with improved thin film dielectrics and method for making same
AssigneeLucent Technologies Inc.
InventorsDaniel Brasen, Eric L. Garfunkel, Martin L. Green, Evgeni Petrovich Gusev
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Abstract
In accordance with the invention an electronic device is provided with a thin film dielectric layer of enhanced reliability. The dielectric comprises a thin film of silicon oxide having maximum concentrations of nitrogen near its major interfaces. In a field effect device, the maximum adjacent the gate enhances resistance to penetration of dopants from the gate. The secondary maximum near the channel enhances resistance to current stress. The maximum near the channel is preferably displaced slightly inward from the channel to minimize effects on carrier mobility.
Claims7
In an electronic device comprising a first conductive layer of doped crystalline silicon substrate and a second conductive layer of doped polycrystalline silicon separated by a dielectric film of nitrogen-doped silicon oxide, said dielectric film having a pair of major interfaces adjacent
- said first and second conductive layers respectively and a thickness of less than about 80 angstroms, the improvement wherein:
- said nitrogen-doped silicon oxide has a nitrogen concentration with a thickness profile characterized by a first maximum concentration located within 15 angstroms from said interface adjacent said polycrystalline silicon and a second maximum located within 15 angstroms from said interface adjacent said crystalline silicon substrate and at least 5 angstroms from said substrate.
In a field effect electronic device comprising a substrate-supported source, drain and channel and a gate electrode overlying said channel, said gate electrode separated from said channel by a dielectric film of nitrogen-doped silicon oxide, said dielectric film having a pair of major interfaces adjacent said gate electrode and said channel, respectively, and a thickness of less than about 80 angstroms, the improvement wherein:
- said nitrogen-doped silicon oxide has a nitrogen concentration characterized by a first maximum concentration located within 15 angstroms from said interface adjacent said gate electrode and a second maximum located within 15 angstroms from said interface adjacent said channel and at least 5 angstroms from said channel.
Dependencies are inferred from the claim text.