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US 5,861,624 AGranted
Atomic force microscope for attachment to optical microscope
AssigneePark Scientific Instruments
InventorsJohn D. Alexander, Marco Tortonese, Thai Nguyen
Life of this patent
Estimating the term…
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AssigneePark Scientific Instruments
InventorsJohn D. Alexander, Marco Tortonese, Thai Nguyen
Estimating the term…
Atomic force microscope system is provided which is designed to be incorporated into or attachable to an objective lens which can be mounted on a lens turret of an optical microscope such that simultaneous atomic force microscopy and optical viewing of a sample through the objective lens can be performed. In one embodiment, the atomic force microscope (AFM) is designed to be removably attached to a standard objective lens of an optical microscope. In another embodiment, the AFM system is designed to be removably attached to an optical microscope and includes integrated optics for providing an optical view. In both embodiments, the optics are used solely for generating an optical view and/or other optical contrast mechanisms and are not used in conjunction with a detection mechanism of the AFM.
A scanning probe microscope (SPM) system removably attachable to an objective of an optical microscope comprising:
A scanning probe microscope (SPM) system removably attachable to an objective of an optical microscope comprising:
A scanning probe microscope (SPM) system removably attachable to an objective of an optical microscope comprising:
A scanning probe microscope (SPM) system removably attachable to an objective of an optical microscope comprising:
Dependencies are inferred from the claim text.