Inspection bench with pivoting arm

Abstract

Apparatus for inspection of a cutting tool by an examination device is provided. The examination tool is preferably a camera. The apparatus includes a base and a cutting tool mounting member on the base for attachment of a cutting tool to be inspected. The mounting member is adapted to position the cutting tool at a viewing location for the camera. There is a movable arm having a mounting location for receiving the camera. The movable arm is mounted to the base for rotation such that the camera moves in a first plane that includes the viewing location. The movable arm is also pivotable away from first plane to a second plane. An aperture through the base permits observation of the viewing location by the camera when the arm is pivoted to the second plane. The apparatus of the present invention permits fast, accurate and consistent measurement of the cutting surface geometry of a cutting tool. Preferably, the mounting location for the camera is movable along the arm and includes a positioning system to automatically adjust the position of the mounting location when the arm is pivoted from the first plane to the second plane to maintain the focus of the camera. By maintaining the focus of the camera between the first and second planes, the apparatus of the present invention permits rapid and accurate inspection of a cutting tool surface using software controlled inspection systems.

Dependencies are inferred from the claim text.