Low overhead input and output boundary scan cells

An electrical circuit, comprising:

• functional circuitry for performing normal operating functions of the electrical circuit;
• an input buffer coupled to said functional circuitry for receiving input signals from a source external to said functional circuitry and driving said input signals to a destination within said functional circuitry;
• a test data path for providing test data;
• memory circuitry coupled to said test data path for storing test data received from said test data path;
• and
• a latching circuit connected to said memory circuitry for receiving and selectively latching test data stored in said memory circuitry, said latching circuit including said input buffer and a feedback path connected in parallel with said input buffer.