Non-volatile circuit that disables failed devices
AssigneeInformation Storage Devices, Inc.
InventorsHagop Nazarian, David Sowards, Lawrence D. Engh, Jung Sheng Hoei, May Lee
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Abstract
The present invention discloses a circuit for controlling operation of a functional circuit in a device based on a test result during testing. The circuit comprises a first storage element configured to be in one of a first state and a second state according to the test result, and a first sensing element coupled to the first storage element for generating a first signal used to control the operation of the functional circuit.
Claims24
A circuit for controlling operation of a functional circuit in a device based on a test result during testing, the circuit comprising:
- a first storage element configured to be in one of a first state and a second state according to said test result;
- and
- a first sensing element coupled to said first storage element for generating a first signal used to control said operation of said functional circuit.
A circuit for controlling operation of a functional circuit in a device based on a test result during testing, the circuit comprising:
- a first set of storage elements configured to be in one of N states according to said test result, said N states including one first state and N-1 second states;
- and
- a first sensing element coupled to said first set for generating a first signal used to control said operation of said functional circuit.
A method for controlling operation of a function circuit in a device based on a test result during testing, the method comprising the steps of:
- configuring a first set of storage elements in one of N states according to said test result, said N states including one first state and N-1 second states;
- and
- generating a first signal from a first sensing element, said first signal being used to control said operation of said functional circuit.
Dependencies are inferred from the claim text.