US 5,856,985 AGranted

Test pattern generator

AssigneeAdvantest Corporation

InventorKenichi Fujisaki

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Abstract

A test pattern generator is provided that can perform a block write function testing at high speed. To achieve this aim, a data register 41 is provided which takes in data signal from a data generator 13 by a first write signal from a control signal generator 15. An address selector 44 is provided which takes in specific bits from an address generated by an address generator 12. A mask data register file 42 is provided which takes the data signal in an area specified by a second write signal from a control signal generator 15. A write data register file 43 is provided which takes the data signal in an area specified by a third write signal from the control signal generator 15. A data formatter 60 is provided that synthesizes and outputs either an output data of the data register 41 or an output data of the data generator 13 based on the above signals. Those components described above comprise the test pattern generator.

Claims2

Dependent claims

A test pattern generator (1) for generating expected value data to carry out logical comparison with an output of a device (2) under test characterized as having:

a data register (41) for taking in a data signal from a data generator (13) by a first write signal from a control signal generator (15);
an address selector (44) for selecting predetermined bits from an address signal generated by an address generator (12);
a mask data register file (42) for storing a data signal from said data generator (13) into an area specified by a data select signal output from said address selector (44) by a second write signal from said control signal generator (15);
a write data register file (43) for storing a data signal from said data generator (13) into an area specified by a data select signal output from said address selector (44) by a third write signal from said control signal generator (15);
A data formatter (60) which synthesizes and outputs the output data of said data register (41) or the output data of said data generator (13) based on the output signal of said address selector (44), the output signal of said mask data register file (42) and the output signal of said write data register file (43).

2 more elements

Dependencies are inferred from the claim text.

Facts

Application: 08/849,682Filed 8 Sep 1997
Granted: 5 Jan 1999
Term ends: Not estimatedThe source records don’t support an estimate.

Classification8 codes

G01R 31/31813
Functional testing: test pattern generators
G01R 31/31919
Stimuli generation or application of test patterns to the device under test [DUT]: storing and outputting test patterns
G01R 31/31928
Stimuli generation or application of test patterns to the device under test [DUT]: formatter
G11C 29/36
Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details: data generation devices, e.g. data inverters