Method and apparatus for testing a magnetic head during manufacture utilizing an internal magnetic field
AssigneeTDK Corporation
InventorsKatsuhiko Tomita, Nozomu Hachisuka, Toshiaki Maeda
Life of this patent
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Abstract
A method and apparatus for testing a magnetic head provided with at least one MR transducer. The method includes a step of applying a sense current varying with respect to time to the MR transducer element via input/output terminals of the MR transducer element, and a step of measuring a terminal voltage across the input/output terminals of the MR transducer element to check varying resistance characteristics of the MR transducer element with respect to the variation of the applied sense current.
Claims16
A method for testing a magnetic head provided with at least one magnetoresistive transducer element and input/output terminals of said magnetoresistive transducer element during manufacture utilizing an internal magnetic field, said method comprising the steps of:
- applying, through a single pair of conductors, a sense current sinusoidally varying with respect to time to said magnetoresistive transducer element via said input/output terminals without applying an external magnetic field to said magnetoresistive transducer element;
- receiving, through said single pair of conductors, a terminal voltage across said input/output terminals of said magnetoresistive transducer element;
- measuring said terminal voltage across said input/output terminals of said magnetoresistive transducer element to check magneto-resistance characteristics of said magnetoresistive transducer element;
- and
- comparing the magneto-resistance characteristics against an acceptable value, wherein said value denotes a usable magnetoresistive transducer.
A method for testing a plurality of magnetic heads provided with at least one magnetoresistive transducer element and input/output terminals of said magnetoresistive transducer element during manufacture utilizing the internal magnetic field, said method comprising the steps of:
- applying, through a single pair of conductors, a sense current sinusoidally varying with respect to time to said magnetoresistive transducer element via said input/output terminals without applying an external magnetic field to said magnetoresistive transducer element, said magnetoresistive transducer element being one of the magnetoresistive transducer elements of said plurality of magnetic heads, wherein said heads, are aligned on a head block and not yet individually separated from the head block;
- receiving, through said single pair of conductors, a terminal voltage across said input/output terminals of said magnetoresistive transducer element;
- measuring said terminal voltage across said input/output terminals of said magnetoresistive transducer element to check magneto-resistance characteristics of said magnetoresistive transducer element;
- comparing the magneto-resistance characteristics against an acceptable value, wherein said value denotes a usable magnetoresistive transducer, said method steps are repeated for each said magnetoresistive transducer element on each said magnetic head located on said head block.
An apparatus for testing a magnetic head provided with at least one magnetoresistive transducer element and input/output terminals of said magnetoresistive transducer element during manufacture utilizing an internal magnetic field, said apparatus comprising:
- a probe means for electrically contacting to said input/output terminals of said magnetoresistive transducer element, wherein said probe means consists of a single pair of conductors;
- a current generation means for providing a sense current sinusoidally varying with respect to time;
- means for applying the provided varying sense current to said magnetoresistive transducer element via said probe means without applying an external magnetic field to said magnetoresistive transducer element;
- means for receiving, through said single pair of conductors, a terminal voltage across said input/output terminals of said magnetoresistive transducer element;
- means for measuring said terminal voltage across said input/output terminals of said magnetoresistive transducer element via said probe means to check magnetoresistance characteristics of said magnetoresistive transducer element;
- and
- means for comparing the magneto-resistance characteristics against an acceptable value, wherein said value denotes a usable magnetoresistive transducer.
An apparatus for testing a plurality of magnetic heads provided with at least one magnetoresistive transducer element and input/output terminals of said magnetoresistive transducer element during manufacture utilizing an internal magnetic field, said apparatus comprising:
- a probe means for electrically contacting to said input/output terminals of said magnetoresistive transducer element of each of said magnetic heads which are aligned on a head block and are not yet individually separated from the head block;
- a current generation means for providing a sense current sinusoidally varying with respect to time;
- means for applying the provided varying sense current to said magnetoresistive transducer element via said probe means without applying an external magnetic field to said magnetoresistive transducer element;
- means for receiving, through said single pair of conductors, a terminal voltage across said input/output terminals of said magnetoresistive transducer element;
- means for measuring said terminal voltage across said input/output terminals of said magnetoresistive transducer element via said probe means to check magneto-resistance characteristics of said magnetoresistive transducer element;
- and
- means for comparing the magneto-resistance characteristics against an acceptable value, wherein said value denotes a usable magnetoresistive transducer.
Dependencies are inferred from the claim text.