Process for fabricating nonvolatile semiconductor memory device having a ferroelectric capacitor

Abstract

A process for fabricating a nonvolatile semiconductor memory device has one transistor and one ferroelectric capacitor electrically connected to each other by a contact plug, which comprising forming a transistor; forming an inter-layer insulating film, at least an upper surface portion thereof being a titanium oxide film; forming a capacitor lower electrode; and forming a capacitor insulating film and a capacitor upper electrode, wherein the lower electrode forming step comprises: depositing a titanium nitride film and a platinum film on the titanium oxide film; etching the platinum film with a first etching gas adapted to suppress deposition of substances including platinum; and etching the titanium nitride film with a second etching gas having a high etching selectivity to the titanium oxide film.

Dependencies are inferred from the claim text.