Multiple bit test pattern generator
AssigneeAdvantest Corporation
InventorKenichi Fujisaki
Life of this patent
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Abstract
A test pattern generator for testing a semiconductor memory with a multi-bit data width and high speed is realized with low cost and small size. The pattern generator includes a data operator having a 1/n width of the data width of a device to be tested, a register which is formed of n bits whose data is established by an instruction memory, and n control logic circuits for controlling the passage of data signals based on the output signal of the register. The control logic circuits include AND gates which transmit the output signal from the data operator based on the output signal of the register and OR gates which provide fixed output signals. The pattern generator further includes an exclusive OR gate for inverting the data based on an output of a flag register.
Claims3
A multiple bit test pattern generator for evaluating a semiconductor device (5) under test having a multiple data bit width, characterized in having:
- a data operator (30) having a 1/n width of said data bit width of said device (5) to be tested;
- a register A(141) having n bits whose data is established by a control signal from an instruction memory (131);
- and
- n control logic circuits (151, 152, 153, 154) for controlling the passage of the output data of the data operator (30) based on an output signal of said register A(141).
A multiple bit test pattern generator characterized in that:
- an exclusive OR gate (35) which reverses the output data of said data operator (30) in response to a reverse signal from a flag register (34) which is controlled by an instruction signal from the instruction memory (131) is provided between said data operator (30) and said control logic area (151, 152, 153, 154).
Dependencies are inferred from the claim text.