Back to results
US 5,852,364 AGranted
System and method for testing integrated circuits connected together
AssigneeTexas Instruments Incorporated
InventorLee D. Whetsel
Life of this patent
Estimating the term…
Abstract
An integrated circuit includes a terminal which is accessible externally of the integrated circuit, and circuitry (LOB) coupled to said terminal and operable to latch at said terminal a signal applied to said terminal by a source (ICT) external to said integrated circuit.
Claims3
An electronic system, comprising:
- A. a first integrated circuit including an external terminal;
- B. a second integrated circuit external of the first integrated circuit and including an external terminal;
- C. a wire connected between the terminals of the first and second integrated circuits;
- D. test circuitry external from the first and second integrated circuits and connected to the wire for maintaining a test signal on said wire for a first amount of time and applying said test signal to said wire only for a second amount of time which is less than said first amount of time.
1 more element
A method of operating an electronic system wherein an external terminal of a first integrated circuit is connected to an external terminal of a second integrated circuit by a wire, and the wire is physically contactable external of the integrated circuits, comprising the steps of:
- A. connecting a terminal of a signal source, which is external to the first and second integrated circuits, to the wire;
- B. providing a signal from the signal source at the wire for a first amount of time;
- and
- C. providing the signal from the signal source at the wire only for a second amount of time which is less than said first amount of time.
1 more element
Dependencies are inferred from the claim text.