Circuitry for propagating test mode signals associated with a memory array

Circuitry for propagating a plurality of test signals to a memory for testing the memory, comprising:

• a plurality of multi-bit registers for storing a plurality of data and for generating the test signals which are sent to the memory in accordance with the data stored, wherein each of the plurality of multi-bit registers comprises a plurality of latches for storing one of the data and each of the data comprises plurality of data bits each of which is stored in one of the plurality of latches;
• an addressing circuit coupled to the plurality of multi-bit registers for receiving a plurality of addresses to serially write the data into the plurality of multi-bit registers in accordance with the addresses, wherein the addressing circuit selects one of the plurality of multi-bit registers to receive one of the data at one time in accordance with one of the addresses received such that the data are serially written into the plurality of multi-bit registers;
• a control circuit coupled to the plurality of multi-bit registers for enabling the plurality of registers to serially store the data and for simultaneously activating each of the plurality of latches in each of the plurality of multi-bit registers to output each of the plurality of data bits of each of the data to simultaneously provide the test signals to the memory after all of the data have been stored in the plurality of multi-bit registers by the addressing circuit.