Burst EDO memory address counter
AssigneeMicron Technology, Inc.
InventorsAdrian E. Ong, Paul S. Zagar, Brett L. Williams, Troy A. Manning
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AssigneeMicron Technology, Inc.
InventorsAdrian E. Ong, Paul S. Zagar, Brett L. Williams, Troy A. Manning
Estimating the term…
A counter comprised of two flip flops and a multiplexer produces a sequential or interleaved address sequence. The addresses produced are used to access memory elements in a Burst Extended Data Output Dynamic Random Access Memory (Burst EDO or BEDO DRAM). Input addresses in combination with a sequence select signal are logically combined to produce a multiplexer select input which selects between true and compliment outputs of a first flip flop to couple to an input of a second flip flop to specify a toggle condition for the second flip flop. Outputs of the counter are compared with outputs of an input address latch to detect the end of a burst sequence and initialize the device for another burst access. A transition of the Read/Write control line during a burst access will terminate the burst access and initialize the device for another burst access.
A memory device comprising a plurality of addressable memory elements, the memory device further comprising:
A memory device comprising a plurality of addressable memory elements, the memory device fuirther comprising:
A control circuit for a two bit address generation circuit used in an integrated memory device and adapted to generate two least significant bits in a series of memory addresses in a selectable one of a plurality of predetermined address sequences, comprising:
A method of performing a burst access of a memory device, comprising:
A data processing system comprising:
Dependencies are inferred from the claim text.