Apparatus and method for soft error comparison testing
AssigneeHewlett-Packard Company
InventorsGregory D. Burroughs, Edward G. Weaver, Jr., Donald L. Rogers
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Abstract
A method and apparatus for soft error comparison testing of electronic components exposed to a flux of high energy particles, while providing for simultaneous comparison testing of different components at full rated operating speed, and providing for programmable control of level of the supply voltage applied to the components. Included a method and apparatus for simultaneously exposing electronic components to a flux of high energy particles, operating the components, and simultaneously measuring soft errors of the components induced by the flux of high energy particles.
Claims16
A method comprising the steps of:
- providing a flux of high energy particles;
- simultaneously exposing the flux to an electronic component of a first functional type having a first design configuration and to another electronic component of the same functional type but having a design configuration different than the first design configuration;
- operating the components;
- and
- simultaneously measuring soft errors of both components induced by the flux of high energy particles.
An apparatus comprising:
- a flux beam of high energy particles;
- an electronic component of a first functional type having a first design configuration;
- and
- another electronic component of the same functional type but having a design configuration different than the first design configuration, wherein both components are simultaneously disposed within the flux beam;
- and
- means coupled with the components for simultaneously measuring soft errors of both components induced by the flux of high energy particles.
An apparatus comprising:
- a flux beam of high energy particles;
- an electronic component of a first functional type having a first design configuration;
- and
- another electronic component of the same functional type but having a design configuration different than the first design configuration, wherein both components are simultaneously disposed within the flux beam;
- and
- at least one processing element coupled with at least one of the components for simultaneously measuring soft errors of both components induced by the flux of high energy particles.
Dependencies are inferred from the claim text.