Ferroelectric memory using non-remnant reference circuit
AssigneeMicron Technology, Inc.
InventorMirmajid Seyyedy
Life of this patent
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AssigneeMicron Technology, Inc.
InventorMirmajid Seyyedy
Estimating the term…
A random access memory circuit uses single ferroelectric memory cells to store data. The ferroelectric memory cells can be selectively read using a reference voltage which is compared to a voltage representative of data stored on the memory cell using a multiplexed sense amplifier. The reference voltage is generated using a non-remnant capacitor circuit coupled to a bit line. In using a non-remnant capacitor circuit, a single-ended reference voltage can be generated on the bit line. The capacitance of the bit line is substantially greater than the capacitance of the non-remnant capacitor, therefore, the resultant reference voltage on the bit line remains relatively constant with fluctuations in supply voltage. A ferroelectric memory cell can then be read by comparing the voltage on its corresponding bit line to the reference voltage using the sense amplifier.
An integrated circuit memory comprising:
An integrated circuit memory comprising:
A method of reading a ferroelectric memory comprising a plurality of ferroelectric memory cells, first and second bit lines, and a sense amplifier, the method comprising the steps of:
An integrated circuit memory comprising:
An integrated circuit memory comprising:
Dependencies are inferred from the claim text.