Collimator for high takeoff angle energy dispersive spectroscopy (EDS) detectors
AssigneeNoran Instruments, Inc.
InventorsSteven J. Foote, Minoru Shinohara
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AssigneeNoran Instruments, Inc.
InventorsSteven J. Foote, Minoru Shinohara
Estimating the term…
A two-piece collimator for use in high takeoff angle energy dispersive spectroscopy (EDS) is provided. The two-piece collimator includes a base section and an extension section. The collimator base section may be attached rigidly to the end of an EDS detector tube. The collimator extension section is removably attached to and extends from the base section. Apertures through the base and extension sections are easily aligned with each other and with an EDS detector. The length of the collimator extension section is preferably selected such that the distal end of the extension section extends below the bottom of an upper pole piece of an electron microscope in which the collimator is employed. A two-piece collimator in accordance with the present invention effectively reduces stray radiation, including back scattered electrons, which may cause artifacts in a detected EDS X-ray spectrum. Alternatively, a collimator in accordance with the present invention may be used in combination with an existing pole piece insert collimation device by removing the extension section from the two-piece collimator.
A collimator for energy dispersive spectroscopy (EDS) detectors, comprising:
The collimator of claim 7 wherein the collimator extension section has a length which is selected such that when the collimator is placed in an EDS detector system the distal end of the collimator extension section extends through an aperture in an upper pole piece to at least 0.1 millimeters below a bottom of the pole piece.
A collimator for energy dispersive spectroscopy (EDS) detectors, comprising:
An improved electron microscope system for performing energy dispersive spectroscopy including an electron beam source, an upper pole piece having an aperture therein through which the electron beam may pass, a sample specimen holder area located below the aperture in the upper pole piece, an EDS detector tube, and an EDS detector mounted in the EDS detector tube, the improvement comprising:
An improved electron microscope system for performing energy dispersive spectroscopy including an electron beam source, an upper pole piece having an aperture therein through which the electron beam may pass, a sample specimen holder area located below the aperture in the upper pole piece, an EDS detector tube, and an EDS detector mounted in the EDS detector tube, the improvement comprising:
Dependencies are inferred from the claim text.