Support device and stage assembly for a scanned-probe microscope
AssigneeBurleigh Instruments, Inc.
InventorsGordon M. Shedd, Kevin J. Owens
Life of this patent
Estimating the term…
Loading patent…
AssigneeBurleigh Instruments, Inc.
InventorsGordon M. Shedd, Kevin J. Owens
Estimating the term…
A support device for a scanned-probe microscope comprises a horizontal base member and a vertical bridge member that are transverse to one another. The horizontal and vertical members are connected at their respective opposite ends by a common chord member extending between the ends. The device preferably includes means for attaching a scanned-probe microscope to a forward surface of the vertical bridge member. The support device preferably further includes one or more bracket members, each attached at one end to the rearward surface of the vertical bridge member and at the opposite end to a rearward surface of the chord member. Each bracket includes a section extending away from the chord member. The horizontal base member and the chord member each has an upper surface substantially coplanar with one another. The substantially coplanar upper surfaces together provide support for a readily separable sample plate. Further in accordance with the invention, a microscope stage assembly comprises the described support device and a readily separable sample plate.
A support device for a scanned-probe microscope comprising:
The support device of claim 3 wherein said means for attaching a scanned-probe microscope is disposed at substantially the midpoint of said vertical bridge member.
A microscope stage assembly for a scanned-probe microscope, said stage assembly comprising:
A scanned-probe microscope assembly comprising:
A support device for a scanned-probe microscope comprising:
A microscope and stage assembly for a scanned-probe microscope comprising:
A scanned-probe microscope assembly comprising:
Dependencies are inferred from the claim text.