Mass resolution by angular alignment of the ion detector conversion surface in time-of-flight mass spectrometers with electrostatic steering deflectors
AssigneeAnalytica of Branford, Inc.
InventorThomas Dresch
Life of this patent
Estimating the term…
Abstract
Electrostatic deflectors are used in a time of flight mass spectrometer to steer ions into a detector positioned at a convenient location at the end of a drift region and where the detector assembly is tilted in relation with the steered ion beam in a manner which improves mass spectral resolution.
Claims34
An apparatus for separation of ionic species using a reflector Time-Of-Flight mass analyzer, comprising:
- an longitudinal instrument axis;
- an electrostatic reflector comprising a reflecting field, said electrostatic reflector defining a longitudinal reflector axis;
- an ion beam steering lens oriented for producing an electrostatic field such that said steering lens can modify the flight path of the ions by deflecting the ions in a plane of deflection which is at an angle of deflection and in a first direction of rotation;
- and,
- an ion detector placed after said reflector at the end of the flight path of the ions, said ion detector comprising a detector surface, said detector surface being tilted with respect to said instrument axis.
An apparatus for separation of ionic species using a reflector Time-Of-Flight mass analyzer, comprising:
- an longitudinal instrument axis;
- an electrostatic reflector comprising a reflecting field, said electrostatic reflector defining a longitudinal reflector axis;
- an ion beam steering lens oriented for producing an electrostatic field such that said steering lens can modify the flight path of the ions by deflecting the ions in a plane of deflection which is at an angle of deflection and in a first direction of rotation;
- and,
- wherein said reflector is tilted with respect to said instrument axis in said plane of deflection by said angle of deflection.
An apparatus for separation of ionic species using a reflector Time-Of-Flight mass analyzer, comprising:
- a longitudinal instrument axis;
- an electrostatic reflector comprising a reflecting field, said electrostatic reflector defining a longitudinal reflector axis;
- an ion beam steering lens oriented for producing an electrostatic field such that said steering lens can modify the flight path of the ions by deflecting the ions in a plane of deflection which is at an angle of deflection and in a first direction of rotation;
- and,
- an ion detector placed after said reflector at the end of the flight path of the ions, said ion detector comprising a detector surface;
- and,
- an adjuster for adjusting the tilt of said detector surface, wherein said adjuster is capable of adjusting said detector surface to a second angle with respect to said instrument axis, wherein said second angle matches said angle of deflection.
A method for separation of ionic species using a reflector Time-Of-Flight mass analyzer, comprising:
- providing ions into a Time-of-Flight mass analyzer having an instrument axis;
- deflecting said ions in a plane of deflection which is at an angle of deflection to said instrument axis and in a first direction of rotation;
- and,
- tilting a component of said mass analyzer to match said angle of deflection.
Dependencies are inferred from the claim text.