Apparatus and method for controlling the temperature of an integrated circuit under test
AssigneeIntel Corporation
InventorDavid R. Grunfeld
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AssigneeIntel Corporation
InventorDavid R. Grunfeld
Estimating the term…
The present invention is an apparatus and method for controlling the temperature of a heat generating device. The invention is particularly adaptable to controlling the temperature of an integrated circuit under test. In one embodiment the invention involves the use of a bellows having a heat slug disposed at one end that is adapted to engage a surface of the heat generating device. The bellows is compliant and includes a cavity containing a heat transfer medium. The bellows cavity is in fluid communication with a heat transfer medium reservoir. Heat is transferred from the heat generating device by engaging the heat slug with a surface of the heat generating device and applying a force to the bellows. The compliant nature of the bellows provides the temperature control apparatus with a self-planarizing feature that maximizes the contact surface area between the heat slug and heat generating device.
An apparatus for cooling the surface of a heat generating device comprising:
A cooling system for transferring heat from a first surface of a semiconductor device comprising:
A method for transferring heat from the surface of a heat generating device, said method comprising the steps of:
A method for transferring heat from the backside of a semiconductor die, said method comprising the steps of:
A method for transferring heat from a semiconductor die, said method comprising the steps of:
An apparatus for cooling a surface of a heat generating device comprising:
Dependencies are inferred from the claim text.