Method and a system for moving a measuring means above a test object
OwnerAnders Eriksson, Jan Eriksson +1inventors
InventorsAnders Eriksson, Jan Eriksson, Per Ohman
Life of this patent
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OwnerAnders Eriksson, Jan Eriksson +1inventors
InventorsAnders Eriksson, Jan Eriksson, Per Ohman
Estimating the term…
A system and a method for moving a measuring device (4, 30) to a plurality of positions above a test object (12), e.g. an electrically or electronically equipped printed board, at which the EMC, of the test object (12) is measured and later stored in a memory together with the position of the measuring device. The system includes a computer (18) and a measuring device (4, 30). The positioning device (8) moves the measuring device (3, 30) across the test object (12) from one position to another, wherein the number of positions and their coordinates are preselected and stored in a computer (18) for a later repetition of the measurement. Each position is assigned with a measurement value which is stored in the memory of the computer (18) together with the coordinates of the measuring device (4, 30). At each position, the power to the control devices is shut-off, in order to minimize interference with the measurements.
A system for repeatedly, by means of a positioning device (8), moving a measuring means (4, 30) to a plurality of measuring positions, comprising a control means with a memory means (18) connected to the positioning device (8) for controlling said positioning device (8) from one position to another, and wherein the measuring means (4, 30) is connected to the control means with a memory means (18) for storing the measurement values obtained by the measuring means (4, 30) in the memory means (18) together with the coordinates of the measuring means (4, 30), the measuring means (4, 30) being designed to measure EMC at preselected positions above a test object (12), the positioning device (8) being arranged to move the measuring means (4, 30) in the x-, y-, and z-direction, and the control means being designed to be dead during the measurement of the EMC.
A method for measuring EMC on a test object (12), comprising the steps of moving a measuring means (4, 30), by means of a positioning device (8), in the x-, y- and z-direction above a test object (12) from one position to another, measuring the EMC of said test object at at least one of said positions, during which measurement the control means of the positioning device (8) is made dead, preselecting and storing the number of said positions and their coordinates in a computer (18) for a later repetition of the measurement, and assigning each position with a value of measurement, which is stored in memory of computer (18) together with the coordinates of said measuring means (4, 30).
Dependencies are inferred from the claim text.