Semiconductor device having improved electronic isolation
AssigneeFujitsu Limited
InventorsToshihide Kikkawa, Tatsuya Ohori, Hirosato Ochimizu
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AssigneeFujitsu Limited
InventorsToshihide Kikkawa, Tatsuya Ohori, Hirosato Ochimizu
Estimating the term…
A semiconductor device includes a buffer layer of AlGaAs that contains oxygen with a concentration level in the approximate range of 8.times.10.sup.17 cm.sup.-3 to 6.times.10.sup.19 cm.sup.-3, and carbon with a concentration level in the approximate range of 2.times.10.sup.16 cm.sup.-3 to 2.times.10.sup.17 cm.sup.-3. A lattice constant of the AlGaAs buffer layer is larger than a lattice constant of the GaAs substrate so a lattice misfit of the AlGaAs layer with respect to the GaAs substrate is equal to or varies by no more than 2.times.10.sup.5 from a corresponding lattice misfit between an undoped AlGaAs crystal with respect to the GaAs substrate. Oxygen atoms occupy an interstitial site, creating a deep impurity level that suppresses side gate effect.
A semiconductor device, comprising:
A semiconductor device, comprising:
Dependencies are inferred from the claim text.