Method for analyzing solid specimen and apparatus therefor
AssigneeNKK Corporation
InventorsTakanori Akiyoshi, Akiko Sakashita, Yohichi Ishibashi, Tadashi Mochizuki, Shigeomi Sato, Toshiya Maekawa
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AssigneeNKK Corporation
InventorsTakanori Akiyoshi, Akiko Sakashita, Yohichi Ishibashi, Tadashi Mochizuki, Shigeomi Sato, Toshiya Maekawa
Estimating the term…
A method for analyzing a solid specimen comprises the steps of: preparing a pulsed laser beam having a frequency of at least 100 Hz and a half width of 1 .mu.sec or less; determining a laser irradiation region; irradiating the pulsed laser beam in an inert gas stream and vaporizing a part of the solid specimen to generate fine particles; transferring said fine particles to a detector; and performing elemental analysis in the detector. An apparatus comprises: laser oscillating device including a semiconductor laser; converging device for converging a laser beam; irradiating device for irradiating the converged laser beam to generate fine particles; an analyzer for performing elemental analysis; and transfer device for transferring the fine particles to said analyzer.
A method for analyzing a solid specimen comprising the steps of:
A method for analyzing a solid specimen including an element in the form of a solid solution and the element in the form of a compound, comprising the steps of:
Dependencies are inferred from the claim text.