Method and apparatus for imaging a sample on a device
AssigneeAffymetrix, Inc.
InventorsMark Trulson, David Stern, Peter Fiekowsky, Richard Rava, Ian Walton, Stephen P. A. Fodor
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Abstract
Labeled targets on a support synthesized with polymer sequences at known locations according to the methods disclosed in U.S. Pat. No. 5,143,854 and PCT WO 92/10092 or others, can be detected by exposing selected regions of sample 1500 to radiation from a source 1100 and detecting the emission therefrom, and repeating the steps of exposition and detection until the sample is completely examined.
Claims7
In a imaging system for imaging a sample on a support having a first surface and a second surface, the sample being located at or near said second surface, said second surface being weakly reflective relative to said first surface, a method for focusing an excitation radiation on said weakly reflective surface comprising the steps of:
- a) focusing excitation radiation on said first surface;
- b) focusing excitation radiation on said second surface;
- and
- c) finely focusing excitation radiation on said second surface.
Dependencies are inferred from the claim text.