Method and apparatus for pseudo-direct access to embedded memories of a micro-controller integrated circuit via the IEEE test access port
AssigneeIntel Corporation
InventorsNick G. Eskandari, David D. Sprague
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AssigneeIntel Corporation
InventorsNick G. Eskandari, David D. Sprague
Estimating the term…
A method and apparatus are provided for testing memory locations of embedded memories or on-board caches of a micro-controller, a micro-processor or a CPU-based integrated circuit through use of a test access port (TAP) such as the IEEE TAP described in "IEEE Standard Test Access Port and Boundary-Scan Architecture" (IEEE Std. 1149.1-1990). The TAP is utilized to serially shift address, data and command information provided by an external host into respective fields of a memory access register (MEMACC) located within a memory interface unit (MIU) of the CPU-based IC. Responsive to the command information, the TAP requests access to the IC's memory bus via the MIU. Next, the address, data and command information for accessing the embedded memory are serially shifted into the MEMACC. If a read operation is specified by the command information, the MIU returns the data stored in the specified memory location of the embedded memory and replaces the data within the data field of the MEMACC with the newly retrieved data. If a write operation is specified by the command information, the MIU transmits the data held in the data field of the MEMACC to the memory location specified. Finally, the data, address and command information stored in the MEMACC are serially shifted out via the TAP to the external host which analyzes the data output therefrom.
A method for performing read and write operations to an embedded memory of an integrated circuit, the method comprising the steps of:
An apparatus for performing read and write operations to an embedded memory of an integrated circuit, the integrated circuit including a CPU one or more internal registers, and a memory interface unit with an access circuitry which provides access to the embedded memory via the memory interface unit without use of the CPU, the internal registers coupled to the memory interface unit for reading and writing memory locations of the embedded memory, the apparatus comprising:
A method for testing an embedded memory of an integrated circuit, the method comprising the steps of:
A method of accessing an embedded memory of an integrated circuit, the method comprising the steps of:
An apparatus for accessing an embedded memory of an integrated circuit, the apparatus comprising:
Dependencies are inferred from the claim text.