Plasma processing method and equipment used therefor
AssigneeNEC Corporation
InventorSeiji Samukawa
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AssigneeNEC Corporation
InventorSeiji Samukawa
Estimating the term…
A plasma processing method is provided which suppresses the charge accumulation on a processing object such as a semiconductor substrate. An alternating excitation signal in the form of pulses for exciting the plasma is supplied to a reaction gas contained in a plasma chamber, each pulse having an on-period t.sub.on for supplying the excitation signal and an off-period t.sub.off for stopping the excitation signal. The off period ranges from 10 to 100 .mu.sec. The on-period may be determined as needed. An alternating bias signal for biasing the processing object is also applied to the object in the chamber. The bias signal has a frequency of at most 600 kHz. As a result, an increased number of positive and negative ions impinge the object thus increasing the processing rate and reducing the charge accumulation compared to prior art processes.
In plasma processing method for processing an object using a plasma, said method comprising the steps of:
A plasma processing method for processing an object using plasma, said method comprising the steps of:
A plasma processing apparatus for processing an object using plasma, said apparatus comprising:
Dependencies are inferred from the claim text.