Teaching method and system for mounted component inspection
AssigneeOMRON Corporation
InventorsShigeki Kobayashi, Norihito Yamamoto
Life of this patent
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Abstract
An operator actuates keyboard (22) to register board name of a board for teaching (ST11), sets a reference board (1S) on a Y-axis table unit (4) to actuate a start key (ST12), inputs reference points of the reference board (1S) to be set to an original position (ST13), takes a picture of a predetermined area on the reference board to teach a mounting position (ST14), and reads data about component image and its decision criteria of the corresponding component from a component kind table (19) to be stored as teaching data (ST15). This operation is repeatedly executed until all components are taught to a mounted component inspection device which inspects mounting qualities of a plurality of components mounted on an inspected board.
Claims8
An apparatus for generating data for inspecting components associated with a printed circuit, comprising:
- a first storage means for storing component information, component direction, and component location;
- a second storage means for storing library data having component identifying data and inspection references corresponding to said component identifying data;
- a third storage means for storing a converting table having identifying information corresponding to said library data;
- and
- a generating means for generating the data for inspecting components using the direction and location of components read from said first storage means, the library data read from said second storage means, and said converting table stored in said third storage means.
The method of generating data for inspecting components associated with a printed circuit comprising:
- storing library data and a converting table in a memory, said library data having component identifying data and inspection references corresponding to said component identifying data, and said converting table having component identifying information corresponding to said library data for identifying said components;
- inputting component information, the direction of the components, and the location of the components;
- and
- generating the data for inspecting the components using he library data, the converting table, the component information, the direction and the location.
A method of teaching data for inspecting components associated with a printed circuit to an apparatus for inspecting components, comprising:
- storing image data of the components and corresponding inspection references to a memory;
- selectively reading a portion of said image data and a corresponding inspection reference from said memory;
- and
- teaching said portion of said image data and the corresponding inspection reference to said apparatus,
- wherein two or more of said components have the same inspection reference.
Dependencies are inferred from the claim text.