Semicoductor device having a hetero interface with a lowered barrier
AssigneeKabushiki Kaisha Toshiba
InventorsShinji Saito, Masaaki Onomura, Yukie Nishikawa, Masayuki Ishikawa, Peter James Parbrook
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AssigneeKabushiki Kaisha Toshiba
InventorsShinji Saito, Masaaki Onomura, Yukie Nishikawa, Masayuki Ishikawa, Peter James Parbrook
Estimating the term…
A semiconductor device includes a first semiconductor layer formed of first semiconductor, a second semiconductor layer formed on the first semiconductor layer and formed of second semiconductor of a group different from a group to which the first semiconductor belongs, and a third semiconductor layer formed between the first and second semiconductor layers, the third semiconductor layer being one of a layer formed of third semiconductor of the same group as the first semiconductor and having an impurity concentration higher than the first semiconductor layer and a layer formed of fourth semiconductor of the same group as the second semiconductor and having an impurity concentration higher than the second semiconductor layer.
A semiconductor device comprising:
Dependencies are inferred from the claim text.