Method and apparatus for the quantitative measurement of the corrosivity effect of residues present on the surface of electronic circuit assemblies

An apparatus for quantitatively measuring the corrosivity effect of residues present on the surface of an electronic circuit assembly, the apparatus comprising:

• (a) an extraction cell for providing an extraction fluid to an electronic circuit assembly ("ECA") area to be measured;
• (b) an extraction fluid for extracting residue from the ECA area to be measured;
• (c) a test cell having a first electrode and a second electrode;
• said test cell further having means for providing a voltage to said first electrode;
• and
• (d) means for measuring the time between the application of the voltage and an electrical short between the electrodes.

A method for quantitatively measuring the corrosivity effect of residues present on the surface of an electronic circuit assembly, the method comprising:

• a. positioning an extraction cell over an electronic circuit assembly ("ECA") area to be measured;
• b. dispensing a non-ionic extraction fluid into said extraction cell;
• c. contacting the ECA area to be measured with said extraction fluid for a time sufficient to extract residue from the ECA area and create a residue-containing fluid;
• d. providing said residue-containing fluid to a test apparatus for measuring the residue levels present in the residue-containing fluid;
• and
• e. using the test apparatus to measure the residue levels present in the residue-containing fluid.