Method of producing high quality silicon surface for selective epitaxial growth of silicon
AssigneeNational Semiconductor Corporation
InventorRashid Bashir
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AssigneeNational Semiconductor Corporation
InventorRashid Bashir
Estimating the term…
A method of producing a high quality silicon surface prior to carrying out a selective epitaxial growth of silicon process for forming an active device region on a substrate. The process flow of the present invention eliminates the need for the sacrificial oxidation layer typically used in such processes. After the etching of a seed hole through the isolation oxide layer using a reactive ion etch a short, low power C.sub.2 F.sub.6 etch is performed. The present invention provides a simple and cost-effective way to eliminate reactive ion etch damage prior to SEG growth because the dry C.sub.2 F.sub.6 etch can be done in the same etch reactor in which the seed hole oxide etch is performed. In addition, the re-oxidation (sacrificial oxide) step is eliminated, reducing the number of process steps.
A method of manufacturing a semiconductor device, comprising:
A method of manufacturing a semiconductor device, comprising:
A method of manufacturing a semiconductor device, comprising:
A method of growing high quality silicon for use in forming an active device region on a substrate, comprising:
A method of growing high quality silicon for use in forming an active device region on a substrate, comprising:
A method of growing high quality silicon for use in forming an active device region on a substrate, comprising:
A method of treating a seed hole formed in an oxide layer overlying a silicon substrate to remove silicon damage and polymers formed during the formation of the seed hole prior to a selective epitaxial growth process, comprising exposing the seed hole in the oxide layer to a C.sub.2 F.sub.6 etch process.
Dependencies are inferred from the claim text.