Semiconductor device and associated fabrication method
AssigneeMatsushita Electric Industrial Co., Ltd.
InventorsTatsuo Sugiyama, Shuji Hirao, Kousaku Yano, Noboru Nomura
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AssigneeMatsushita Electric Industrial Co., Ltd.
InventorsTatsuo Sugiyama, Shuji Hirao, Kousaku Yano, Noboru Nomura
Estimating the term…
A first electrode and a first insulating layer of electrode insulation are formed on a first semiconductor substrate. A second electrode and a second insulating layer of electrode insulation are formed on a second semiconductor substrate. The first semiconductor substrate has at its surface a pattern of recesses/projections (i.e., a pattern of sawteeth in cross section) at regular intervals in stripe arrangement. Likewise, the second semiconductor substrate has at its surface a pattern of recesses/projections (i.e., a pattern of sawteeth in cross section) at regular intervals in stripe arrangement, wherein the pattern of the second semiconductor substrate has a phase shift of 180 degrees with respect to the pattern of the first semiconductor substrate. The first and second semiconductor substrates are bonded together with their patterns in engagement.
A method of fabricating a semiconductor device comprising:
A method of fabricating a semiconductor device comprising:
A method of fabricating a semiconductor device comprising:
A method of fabricating a semiconductor device comprising:
A method of fabricating a semiconductor device comprising:
Dependencies are inferred from the claim text.