US 5,744,971 AGranted

Device and apparatus for measuring dielectric properties of materials

OwnerTsing Yee Amy Chan, Marianne Odlyhainventors

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Abstract

A probe (1) is used to measure the dielectric properties of rigid or semi-rigid materials (4), for example, works of art. The probe comprises an inner conductor and an outer, coaxial, conductor separated by a layer of insulator e.g. Teflon (TM). The probe is coupled to a network analyzer (11), which provides microwave frequency radiation which is transmitted by the probe onto the surface of the material where it is reflected back from the surface back down the probe to the analyzer, where it is analyzed to give measurements on the dielectric properties of the material. The probe typically has an outside diameter of around 0.86 mm, and because of its size allows measurements to be made, non-invasively, and in real time on small areas of material. The outside diameter can be made of the order of microns by selecting the frequency of the radiation, which allows measurements to be made in a sample of a semi-rigid material e.g. a layer of paint for depth profiling. The probe has particular application in the measuring of works of art.

Claims5

Dependent claims

An apparatus for measuring the dielectric properties of rigid and semi-rigid materials, the apparatus comprising a probe having an inner conductor, and an outer conductor coaxial with the inner conductor, the probe having a first open end for contacting with the material without penetrating the surface thereof and a second end coupled to means for providing electromagnetic radiation having a frequency in the microwave range of the electromagnetic spectrum between 50 MHz and 20 GHz to the inner conductor for transmission thereby to the material through the first open end, and to means for analyzing the electromagnetic radiation transmitted to the material, reflected therefrom and transmitted back to the analyzing means via the outer conductor to provide a measurement of the dielectric properties of the material therefrom and to determine the moisture content of the material from the following formula:

(Y/2.pi..rho.).intg..sub.a.sup.b E.sub..rho..sup.a (.rho.)d.rho.=(j.sub.-- .di-elect cons./2.pi.).intg..sub.a.sup.b .intg..sub.0.sup.2.pi. E.sub..rho..sup.a (.rho.) cos (.PHI.'-.PHI.) exp (-jk.sub.2 R.sub.1)!/R.sub.1 d.PHI.'d.rho.'-.SIGMA.B.sub.n.sup.- .PHI..sub.n.sup.- (.rho.),
wherein the primed coordinates correspond to simulated source points to predict the magnetic field in the sample region, R is the distance from the source point to a corresponding field point at z=0 and R.sup.2 =.rho..sup.2 +.rho..sup.'2 -2.rho..rho.'cos(.PHI.'-.PHI.), E.sub..rho.a (.rho.) is the electric field at the open end of the probe, Y the admittance, .PHI..sub.n '(.rho.) is the derivative of the potential function .PHI..sub.n (.rho.), with respect to .rho. where n is the order of the Tm.sub.on mode, B is the relative amplitude of the corresponding order mode propagating in the -z direction, k.sub.2 is the wave number in the sample, and w is the angular frequency.

Dependencies are inferred from the claim text.