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AssigneeLambda Research, Inc.
InventorsPaul S. Prevey, III, Glenn A. Plunkett
Estimating the term…
The present invention is directed to an automated system for use in the determination of subsurface material properties of a specimen by X-ray diffraction, comprising a specimen support, a rotatable mounting and aligning fixture for mounting the specimen support onto the shaft of a motor driven positioning system, a chemical holding tank having a first half section having a chemical holding chamber for providing a chemical bath for removing surface material from the specimen and a second half section for providing a position for permitting X-ray diffraction measurement of the specimen, a chemical reservoir in fluid communication with the chemical holding chamber of chemical holding tank to provide a steady supply of chemical solution to the chemical holding chamber through a closed loop system, a neutralization tank for receiving contaminated rinse water from the chemical holding tank, and an electronic controller for controlling the cycling of the specimen between the chemical holding chamber and the position for receiving a beam of X-rays from an X-ray source.
An automated system for use with an X-ray diffraction system having an X-ray source for directing a beam of X-rays to the surface of a specimen and a detector for detecting diffracted radiation extending and expanding outwardly from the surface of the specimen, the automated system comprising:
An automated system for use with an X-ray diffraction system having an X-ray source for directing a beam of X-rays to the surface of a specimen and a detector for detecting diffracted radiation extending and expanding outwardly from the surface of the specimen, the automated system comprising:
An automated system for use with an X-ray diffraction system having an X-ray source for directing a beam of X-rays to the surface of a specimen and a detector for detecting diffracted radiation extending and expanding outwardly from the surface of the specimen, the automated system comprising:
An automated system for use with an X-ray diffraction system having an integrated X-ray source for directing a beam of X-rays to the surface of a specimen and a detector for detecting diffracted radiation extending and expanding outwardly from the surface of the specimen, the automated system comprising:
Dependencies are inferred from the claim text.