# US 5,708,692 A · Measurement system for chromium content in chromized layers and the like

> Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt

- Number: US 5,708,692 A
- Document ID: US5708692A
- Status: Granted
- Kind: A
- Application number: 08/758,806
- Filed: 1996-12-03
- Granted: 1998-01-13
- Earliest claimed: 1996-12-03
- Assignees: The Babcock & Wilcox Company
- Inventors: Dennis Connolly; Walter R. Mohn; Bart A. Stuchell
- Web page: https://patentgrep.com/patent/US5708692A

## CPC

- G01N 23/085: X-ray absorption fine structure [XAFS], e.g. extended XAFS [EXAFS]
- G01N: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES (measuring or testing apparatus or processes other than immunoassay, involving enzymes or microorganisms C12M, C12Q)

## Abstract

A method and apparatus for measuring a target analyte diffused in a wall of a metal member provides a sample of the metal member which is cut to progressively reduce a wall thickness of the sample from zero at a first point on the sample to a selected depth at a second point on the sample. An x-ray analyzing system having an analyzing slot is moved past the sample between the first and second points. Data from the x-ray analyzing system during the translation of the sample is collected to analyze the analyte content.

## Claims

### Claim 1

A method for measuring a target analyte diffused in a wall of a metal member, comprising:
providing a sample of the metal member;
cutting a surface of the sample to progressively reduce a wall thickness of the sample from zero at a first point on the sample to a selected depth at a second point on the sample;
providing an x-ray analyzing system having an analyzing slot;
translating the sample between the first and second points, and past the slot; and
accumulating data from the x-ray analyzing system during the translation of the sample.

### Claim 2 (depends on 1)

The method according to claim 1, wherein the analyte comprises a metal.

### Claim 3 (depends on 2)

The method according to claim 2, wherein the analyte metal is chromium.

### Claim 4 (depends on 3)

The method according to claim 3 wherein the metal member is a tube, the method including rotating the tube past the slot.

### Claim 5 (depends on 2)

The method according to claim 2 wherein the metal member is a tube, the method including rotating the tube past the slot.

### Claim 6 (depends on 1)

The method according to claim 1 wherein the metal member is a tube, the method including rotating the tube past the slot.

### Claim 7 (depends on 6)

The method according to claim 6 including moving the tube linearly past the slot and rotating the tube for producing a profile of the entire wall of the tube between the points.

### Claim 8 (depends on 7)

The method according to claim 7 wherein the analyte is a metal.

### Claim 9 (depends on 8)

The method according to claim 8 wherein the analyte metal is chromium.

### Claim 10

A system for measuring a target analyte diffused in a wall of a metal member, comprising:
a sample of the metal member which has a surface with a wall thickness that has been cut down from zero at a first point on the sample, to a selected depth at a second point on the sample;
an x-ray analyzing system having an analyzing slot; and
means for translating the sample between the first and second points and past the slot for accumulating data from the x-ray analyzing system during the translation of the sample.

### Claim 11 (depends on 10)

The system according to claim 10 including means for rotating the sample and linearly translating the sample, the sample being a tube.

### Claim 12 (depends on 11)

The system according to claim 11 wherein the tube has a chromium diffusion layer in the wall thickness.