# US 5,707,051 A · Wafer stage apparatus for attracting and holding semiconductor wafer > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 5,707,051 A - Document ID: US5707051A - Status: Granted - Kind: A - Application number: 08/632,325 - Filed: 1996-04-17 - Granted: 1998-01-13 - Earliest claimed: 1993-08-13 - Assignees: Kabushiki Kaisha Toshiba - Inventors: Hitoshi Tsuji - Web page: https://patentgrep.com/patent/US5707051A ## CPC - B25B 11/005: {Vacuum work holders} - H10P 72/78: using vacuum or suction, e.g. Bernoulli chucks - Y10T 279/11: Vacuum - B25B: TOOLS OR BENCH DEVICES NOT OTHERWISE PROVIDED FOR, FOR FASTENING, CONNECTING, DISENGAGING, OR HOLDING - H10P: GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10 - Y10T: TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION ## Abstract A wafer stage is provided with a plurality of through holes in its central and peripheral portions. To each of the through holes is coupled an end of a vacuum line the other end of which is coupled to a vacuum pump. With each of the vacuum lines is associated a respective one of electromagnetic valves. A controller controls the timing of opening of the electromagnetic valves. When a wafer placed on the stage is warped so that its central portion is higher than its peripheral portion, the electromagnetic valves associated with the vacuum lines coupled to the peripheral portion of the stage are opened first and the electromagnetic valves associated with the vacuum lines for the central portion of the stage are opened next. When a wafer placed on the stage is warped so that its central portion is lower than its peripheral portion, on the other hand, the electromagnetic valves associated with the vacuum lines coupled to the central portion of the stage are opened first and the electromagnetic valves associated with the vacuum lines for the peripheral portion of the stage are opened next. This permits a greatly warped wafer to be attracted to the stage in a state where it is made flat. ## Claims ### Claim 1 A wafer stage apparatus comprising: a stage provided with a plurality of first through holes for attracting a wafer placed on its surface; a plurality of wafer attracting means placed in central and peripheral portions of said stage, each of said wafer attracting means having a second hole for attracting said wafer and being movable up and down so that it can project from the surface of said wafer; driving means for driving said wafer attracting means individually, said driving means bringing said wafer attracting means into contact with said wafer placed on said stage; a plurality of first vacuum lines each of which has its one end coupled to a respective one of said first through holes and its other end coupled to a vacuum pump; a plurality of second vacuum lines each of which has its one end coupled to a respective one of said second through holes and its other end coupled to a vacuum pump; first breaking means, each of which is provided in the intermediate portion of a respective one of said first vacuum lines, for breaking and opening said first vacuum lines; second breaking means, each of which is provided in the intermediate portion of a respective one of said second vacuum lines, for breaking and opening said second vacuum lines; and control means responsive to a warp in said wafer for controlling the distance through which said wafer attracting means are moved up by said driving means and the timing of opening of said first and second breaking means. ### Claim 2 (depends on 1) The apparatus according to claim 1, wherein said control means has information indicating the direction in which said wafer is warped stored previously therein and controls the order of closing of said first and second breaking means accordingly. ### Claim 3 (depends on 1) The apparatus according to claim 1, further comprising a sensor provided in the neighborhood of said stage for sensing the direction of a warp in said wafer and informing said controller of the direction of said warp thus sensed. ### Claim 4 (depends on 1) The apparatus according to claim 1, wherein said driving means is equipped with a pressure sensor which is responsive to a change in pressure to detect that said wafer attracting means is brought into contact with said wafer. ### Claim 5 A wafer stage apparatus comprising: a stage provided with a plurality of first through holes for attracting a wafer placed on its surface; a plurality of wafer attracting means placed in central and peripheral portions of said stage, each of said wafer attracting means having a second hole for attracting said wafer and being movable up and down so that it can project from the surface of said wafer; driving means for driving said wafer attracting means individually, said driving means bringing said wafer attracting means into contact with said wafer placed on said stage; a plurality of first vacuum lines each of which has its one end coupled to a respective one of said first through holes and its other end coupled to a vacuum pump; a plurality of second vacuum lines each of which has its one end coupled to a respective one of said second through holes and its other end coupled to a vacuum pump; first valves, each of which is provided in the intermediate portion of a respective one of said first vacuum lines, for breaking and opening said first vacuum lines; second valves, each of which is provided in the intermediate portion of a respective one of said second vacuum lines, for breaking and opening said second vacuum lines; and control means for, when said wafer has its central portion higher than its peripheral portion, opening said second valves to permit said wafer attracting means to attract said wafer and said driving means to move said wafer to the position of contact with said stage and opening said first valves to attract said wafer to said stage. ### Claim 6 (depends on 5) The apparatus according to claim 5, wherein said control means has information indicating the direction in which said wafer is warped stored previously therein and controls the order of closing of said first and second valves accordingly. ### Claim 7 (depends on 5) The apparatus according to claim 5, further comprising a sensor provided in the neighborhood of said stage for sensing the direction of a warp in said wafer and informing said controller of the direction of said warp thus sensed. ### Claim 8 (depends on 5) The apparatus according to claim 5, wherein said driving means is equipped with a pressure sensor which is responsive to a change in pressure to detect that said wafer attracting means is brought into contact with said wafer.