# US 5,706,300 A · Testing device for interfaces

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- Number: US 5,706,300 A
- Document ID: US5706300A
- Status: Granted
- Kind: A
- Application number: 08/433,199
- Filed: 1995-05-02
- Granted: 1998-01-06
- Earliest claimed: 1994-05-03
- Assignees: Siemens Aktiengesellschaft
- Inventors: Matthias Wedel
- Web page: https://patentgrep.com/patent/US5706300A

## CPC

- G06F 11/221: {to test buses, lines or interfaces, e.g. stuck-at or open line faults}
- G01R 31/2834: {Automated test systems [ATE]; using microprocessors or computers (G01R31/317 takes precedence; ATE for detection of defective computer hardware G06F11/2736)}
- G06F: ELECTRIC DIGITAL DATA PROCESSING (computer systems based on specific computational models G06N)
- G01R: MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES (indicating correct tuning of resonant circuits H03J3/12)

## Abstract

An interface testing apparatus, comprising: a unit having a flexible logic module that is reconfigurable to evaluate data and control signals; connectors operatively configured to connect the unit to data and control buses at an interface between two other components coupled to and they communicate the data and control signals over the data and control buses; level connectors operatively coupled between the connectors and the unit to condition the data and control signals; memory modules operatively coupled to the unit; a reset logic unit operatively coupled to the unit; and a computer operatively coupled to the unit such that the flexible logic unit can be reconfigured by the computer as required for a given test and to receive from the unit results from a given test.

## Claims

### Claim 1

An interface testing apparatus, comprising:
a unit having a flexible logic module that is reconfigurable to evaluate data and control signals;
connectors operatively configured to connect the unit to data and control buses at an interface between two other components coupled thereto and that communicate the data and control signals over the data and control buses;
level connectors operatively coupled between the connectors and the unit to condition the data and control signals;
memory modules operatively coupled to the unit;
a reset logic unit operatively coupled to the unit; and
a computer operatively coupled to the unit such that the flexible logic module can be reconfigured by the computer as required to effect a test of the interface and to receive from the unit results from the test.

### Claim 2 (depends on 1)

The apparatus of claim 1, wherein the unit is configured to be switched between a plurality of modes.

### Claim 3 (depends on 1)

The apparatus of claim 1, wherein the two components are an imaging system and a camera of an X-ray diagnostics system.

### Claim 4 (depends on 3)

The apparatus of claim 3, wherein the unit is configured to check signals from both the imaging system as well as the camera unit of the X-ray diagnostics system.

### Claim 5 (depends on 3)

The apparatus of claim 3, wherein the unit can be switched between a plurality of modes, and in one of the modes, the unit simulates reactions of the camera unit to control and data signals transmitted from the imaging system.

### Claim 6 (depends on 3)

The apparatus of claim 3 wherein the unit can be switched between a plurality of modes, and in one of the modes, the unit monitors interface instructions communicated between the camera unit and the imaging system.

### Claim 7 (depends on 3)

The apparatus of claim 3, wherein the unit can be switched between a plurality of modes, and in one of the modes, the unit simulates the imaging system.

### Claim 8

An apparatus for testing a data and control bus interface between an imaging system and a camera unit in an X-ray diagnostics system, comprising:
connectors for coupling the apparatus to the data and control buses;
a flexible logic module configurable for conducting a test of the interface;
level converters operatively interposed between the connectors and the flexible logic module to condition data and control signals exchanged between the flexible logic module and the first connectors;
memory devices operatively coupled to the flexible logic module;
a serial interface operatively connected to the flexible logic module;
a computer operatively coupled to the serial interface in such a manner that the computer can control the configuration of the flexible logic module to effect such testing of the data and control bus interface and receive data from the flexible logic module as it conducts the test of the interface.

### Claim 9 (depends on 8)

The apparatus of claim 8, wherein the module is configured to check signals from both the imaging system as well as the camera unit of the X-ray diagnostics system.

### Claim 10 (depends on 8)

The apparatus of claim 8, wherein the module is configured to be switched between a plurality of modes.

### Claim 11 (depends on 10)

The apparatus of claim 10, wherein in one of the modes, the module simulates reactions of the camera unit to control and data signals transmitted from the imaging system.

### Claim 12 (depends on 10)

The apparatus of claim 10, wherein in one of the modes, the module simulates the imaging system.

### Claim 13 (depends on 10)

The apparatus of claim 10 wherein in one of the modes the module monitor instructions exchanged between the camera unit and the imaging system simulates the camera unit.