# US 5,703,924 A · X-ray tube with a low-temperature emitter

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- Number: US 5,703,924 A
- Document ID: US5703924A
- Status: Granted
- Kind: A
- Application number: 08/627,999
- Filed: 1996-04-04
- Granted: 1997-12-30
- Earliest claimed: 1995-04-07
- Assignees: Siemens Aktiengesellschaft
- Inventors: Erich Hell; Helmut Kuhn; Mathias Hoernig
- Web page: https://patentgrep.com/patent/US5703924A

## CPC

- H01J 35/16: Vessels; Containers; Shields associated therewith
- H01J 35/064: {Details of the emitter, e.g. material or structure (H01J35/065 takes precedence)}
- H01J 2235/168: against charged particles
- H01J: ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS (spark-gaps H01T; electric arc lamps H05B31/00; particle accelerators H05H)

## Abstract

An x-ray tube has an anode and an electron emitter from which an electron beam emanates, the electron beam impinging the incident surface of the anode in a focal spot from which a useful x-ray beam emanates. At least in the region of its electron-emitting surface, the electron emitter is formed of an electron-emitting material that has a lower electron affinity than tungsten (a low-temperature emitter). Further, an apertured diaphragm at anode potential is arranged between the electron emitter and the anode and through which the electron beam passes. As electron-emitting material, the electron emitter contains lanthanum hexaboride (LaB.sub.6) or an alloy of the systems iridium/cerium (Ir/Ce) or iridium/lanthanum (Ir/La) systems.

## Claims

### Claim 1

An x-ray tube comprising:
an anode at an anode potential, said anode having an incident surface with a surface normal;
an electron emitter which emits an electron beam which strikes said incident surface of said anode in a focal spot, thereby producing an x-ray beam emanating from said focal spot and ions, said x-ray beam having a central ray, said electron emitter having an electron-emitting surface and said electron emitter comprising, at least in a region of said electron-emitting surface, electron-emitting material having a lower electron affinity than tungsten;
said electron emitter being disposed in a region subject to permeation by said ions:
means for protecting said region of said electron-emitting surface from being struck by said ions consisting of a diaphragm at anode potential disposed between said electron emitter and said anode having an aperture through which said electron beam passes, said diaphragm being disposed perpendicularly relative to said electron beam; and
said electron emitter being disposed relative to said anode so that said electron beam is incident on said focal spot at a first angle relative to said surface normal which is greater than 45.degree., and so that said central ray of said x-ray beam is disposed at a second angle relative to said surface normal which is substantially equal to said first angle.

### Claim 2 (depends on 1)

An x-ray tube as claimed in claim 1 wherein said electron-emitting material comprises material selected from the group consisting of lanthanum oxide-doped tungsten, lanthanum oxide-doped molybdenum, and thoriated tungsten.

### Claim 3 (depends on 1)

An x-ray tube as claimed in claim 1 wherein said electron emitter comprises an electron emitter which emits an electron beam having a substantially circular cross-section.

### Claim 4 (depends on 1)

An x-ray tube as claimed in claim 1 wherein said electron-emitting material comprises an alloy of first and second elements, wherein said first element is selected from the group consisting of rhenium and a column VIII metal, and wherein said second element is selected from the group consisting of barium, calcium, lanthanum, yttrium, gadolinium, cerium, thorium and uranium.

### Claim 5 (depends on 4)

An x-ray tube as claimed in claim 4 wherein said electron-emitting material comprises lanthanum hexaboride.

### Claim 6 (depends on 4)

An x-ray tube as claimed in claim 4 wherein said electron-emitting material comprises an alloy system selected from the group consisting of iridium/cerium, iridium/lanthanum and iridium/platinum alloy systems.