# US 5,703,496 A · Method and apparatus for limiting the slew rate of output drivers by selectively programming the threshold voltage of flash cells connected thereto > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 5,703,496 A - Document ID: US5703496A - Status: Granted - Kind: A - Application number: 08/623,412 - Filed: 1996-03-28 - Granted: 1997-12-30 - Earliest claimed: 1995-09-26 - Assignees: Intel Corporation - Inventors: Gregory D. Sabin - Web page: https://patentgrep.com/patent/US5703496A ## CPC - H03K 19/00361: {in field effect transistor circuits} - H03K 19/018585: {programmable} - H03K: PULSE TECHNIQUE (measuring pulse characteristics G01R; modulating sinusoidal oscillations with pulses H03C; transmission of digital information H04L; discriminator circuits detecting phase difference between two signals by counting or integrating cycles of oscillation H03D3/04; automatic control, starting, synchronisation or stabilisation of generators of electronic oscillations or pulses where the type of generator is irrelevant or unspecified H03L; coding, decoding or code conversion, in general H03M) ## Abstract The output driver includes a plurality of transistor devices connected to an output line. In one arrangement, a separate flash-programmable element is connected to each of the plurality of transistor devices. Each of the separate flash elements receives the data signal along an input line and outputs the data signal if the flash cell is enabled (or not programmed) and outputs a constant voltage level, regardless of the data signal, if the flash element is not enabled. Hence, only those output transistors connected to flash elements that have been enabled are triggered by the output signal. Other transistors merely receive a constant voltage and are, therefore, not triggered regardless of the output signal. In another arrangement, the output driver is configured to forward output signals to all of the output transistors but the flash cells are programmed to adjust a time delay occurring prior to reception by the output transistors. This is achieved by setting the threshold voltage for the flash elements to differing values. The flash cells may be programmed to provide sequentially increasing time delays. Hence, the corresponding output transistors are activated sequentially resulting in a reduction in the increase of current drawn as a function of time, thereby reducing the total amount of voltage noise. In either arrangement, the various flash-programmable elements of the output drivers of the integrated circuit chip are programmed after fabrication of the chip. ## Claims ### Claim 1 In an output driver for outputting signals, subject to a current change slew rate, from an integrated circuit chip wherein the output driver includes a plurality of transistor devices connected to an output line, an improvement comprising: programmable means for selecting the slew rate for output signals driven by the output driver, said programmable means including a separate flash-programmable element connected to each respective transistor device, with each of said separate flash-programmable elements configured to receive a data signal along an input line and output the data signal to the respective transistor device subject to a delay dependent upon a degree of programming of the flash element. ### Claim 2 (depends on 1) The improvement of claim 1 wherein each flash element comprises: a flash cell transistor having a gate connected to the input line, a source connected to a ground, and a drain; a buffer having an input connected to the drain of the flash cell and an output connected to a respective output transistor device; and a circuit for biasing a node interconnecting the drain of the flash cell transistor and the input of the amplifier to a predetermined voltage level. ### Claim 3 (depends on 2) The improvement of claim 2 wherein the output driver operates between a high voltage V.sub.CC and a low voltage V.sub.SS and wherein the flash cell transistor has a threshold voltage set between the V.sub.CC and V.sub.SS. ### Claim 4 (depends on 2) The improvement of claim 2 wherein the output driver operates between a high voltage V.sub.CC and a low voltage V.sub.SS and wherein the flash cell transistor has a threshold voltage set below V.sub.SS. ### Claim 5 An output driver having a programmable slew rate for use on an integrated circuit, said output driver comprising: a data line for providing data to be output from the integrated circuit to the system bus; a plurality of output driver transistor devices each having an output connected to a common output pad; and a plurality of programmable flash devices, with each flash device connected between the data line and an input of a respective one of the output transistor devices, with each said flash device outputting a data signal provided by the data line subject to a delay dependent upon a degree of programming of the flash device such that individual ones of the plurality of output driver transistor devices can receive output signals at differing times. ### Claim 6 (depends on 5) The output driver of claim 5 wherein each flash element comprises: a flash cell transistor having a gate connected to the input line, a source connected to a ground, and a drain; a buffer having an input connected to the drain of the flash cell and an output connected to a respective output transistor device; and a circuit for biasing a node interconnecting the drain of the flash cell transistor and the input of the amplifier to a predetermined voltage level. ### Claim 7 (depends on 6) The output driver of claim 6 wherein the output driver operates between a high voltage V.sub.CC and a low voltage V.sub.SS and wherein the flash cell transistor has a threshold voltage set between the V.sub.CC and V.sub.SS. ### Claim 8 (depends on 6) The output driver of claim 6 wherein the output driver operates between a high voltage V.sub.CC and a low voltage V.sub.SS and wherein the flash cell transistor has a threshold voltage set below V.sub.SS. ### Claim 9 (depends on 5) The output driver of claim 5 wherein the plurality of output driver transistor devices includes a first plurality of P-MOS transistors and a second plurality of N-MOS transistors, with gates of the P-MOS and N-MOS transistors connected to outputs of sense amplifiers of separate respective flash devices. ### Claim 10 (depends on 6) The output driver of claim 6 wherein the circuit for biasing the voltage comprises a P-MOS transistor having a gate connected to a ground, a source connected to a high voltage source, a drain connected to the node, and a feedback path connected from the source to a substrate of the transistor. ### Claim 11 For use in an output driver of an integrated circuit wherein the output driver includes a data line for providing data, a plurality of output transistor devices each having an output connected to a common output pad, and a plurality of programmable flash devices with each device connected between the data line and an input of a respective one of the output transistor devices, a method comprising the steps of: selectively programming the flash devices to provide differing amounts of delay to a received data signal; and routing a data signal in parallel through the flash devices such that the respective output transistor devices receive versions of the signal subject to differing delays. ### Claim 12 (depends on 11) The method of claim 11 wherein the step of selectively programming the flash devices is formed to provide incrementally differing threshold voltages. ### Claim 13 (depends on 12) The method of claim 12 wherein the threshold voltages are set to provide a substantially equal differential in threshold voltage between flash devices such that the signal is incrementally delayed by substantially equal amounts of time delay. ### Claim 14 (depends on 11) The method of claim 11 wherein the output driver operates between a high voltage of V.sub.CC and a low voltage of V.sub.SS and wherein the step of selectively programming the flash devices is performed to provide threshold voltages between V.sub.CC and V.sub.SS. ### Claim 15 (depends on 11) The method of claim 11 wherein the output driver operates between a high voltage of V.sub.CC and a low voltage of V.sub.SS and wherein the step of selectively programming the flash devices is performed to provide threshold voltages below V.sub.SS. ### Claim 16 A method for selecting the slew rate of an output driver for use on an integrated circuit, said method comprising the steps of: fabricating in integrated circuit having output transistors connected to flash programmable cells with the flash programmable cells configured to control an amount of time delay occurring before reception of an output signal by a respective output transistor; determining a permissible voltage noise level for the integrated circuit; and programming a selected portion of the flash programmable cells to provide selected amounts of time delay for reception of output signals by respective output transistors to maintain the voltage noise level within the permissible voltage noise level. ### Claim 17 A computer system comprising: a microprocessor, a memory unit and a input/output unit; and a system bus interconnecting the microprocessor, memory unit and input/output unit, wherein the microprocessor includes an integrated circuit having an output driver including a data line for providing data to be output from the integrated circuit to the system bus, a plurality of output driver transistor devices each having an output connected to a common output pad, and a plurality of programmable flash devices, with each flash device connected between the data line and an input of a respective one of the output transistor devices, with each said flash device outputting a data signal provided by the data line subject to a delay dependent upon a degree of programming of the flash device such that individual ones of the plurality of output driver transistor devices can receive output signals at differing times.