A process for grinding a semiconductor wafer comprising flattening a thin, disc-like, sliced wafer by simultaneously grinding both sides of the wafer by passing the wafer in a wafer feed direction between paired cylindrical rotating grinding rolls supported at both ends in bearings, one of said rotating grinding rolls being held in a fixed location and the other of the rotating grinding rolls being selectively movable toward and away from said one grinding roll, said rotating grinding rolls being rotated in a direction such that surfaces of the rolls which contact the wafer move opposite said wafer feed direction.