Surface inspection method and apparatus
AssigneeHitachi Electronics Engineering Co., Ltd.
InventorsTetsuya Watanabe, Yoshio Morishige, Hisato Nakamura
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AssigneeHitachi Electronics Engineering Co., Ltd.
InventorsTetsuya Watanabe, Yoshio Morishige, Hisato Nakamura
Estimating the term…
A surface inspection apparatus of the present invention comprises an optical sensor having a plurality of detecting portions arranged in a sub-scan direction, the detecting portions being responsive to the scattering light for producing the detection signals correspondingly to respective pixels, a detection optical system including an objective lens and disposed between the optical sensor and the thing to be inspected, a projection optical system for irradiating the thing to be inspected with the laser beam having a cross sectional area large enough to cover the scattering light to be received by the plurality of the detecting portions through the detection optical system and an inspection device responsive to the detection signals for inspecting the surface of the thing to be inspected, wherein one of the detection optical system lens and the optical sensor is mounted such that a setting axis thereof is aligned in a plane perpendicular to an optical axis of the detection optical system lens with a light receiving direction which makes an angle with respect to the sub scan direction and in which shading is minimum.
A surface inspection apparatus in which a surface condition of a thing to be inspected is inspected on the basis of detection signals each corresponding to intensity of scattering light obtained by X-Y scanning the thing to be inspected with a laser beam making a predetermined angle with respect to a surface of the thing in one of X and Y direction as a main scan direction and the other as a sub-scan direction, said surface inspection apparatus comprising:
A method of inspecting a surface of a thing, in which a surface condition of a thing to be inspected is inspected on the basis of detection signals from an optical sensor having a plurality of detecting portions arranged in the sub-scan direction, each of said detection signals corresponding to intensity of scattering light obtained by X-Y scanning the thing to be inspected with a laser beam making a predetermined angle with respect to a surface of the thing in one of X and Y direction as a main scan direction and the other as a sub-scan direction, said surface inspection method comprising:
Dependencies are inferred from the claim text.