Laser beam analyzer
AssigneeCommissariat a l'Energie Atomique
InventorsJean-Pascal Alfille, Jean Raoux
Life of this patent
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Abstract
A device for sampling a section of a laser beam using an elongated reflective element that is moved in a main direction that corresponds to the direction of elongation of the element and in a direction perpendicular to the main direction. This sampling device forms a part of a laser beam analyzer and provides a small reflected beam segment to the analyzer that corresponding to the part of the laser beam that impinges upon the moving elongated reflecting element.
Claims16
A device for sampling a cross-section portion of a laser beam, said device comprising:
- an elongated reflective wire;
- and
- a supporting and driving structure operative to cause the movement of the elongated reflective wire with a complex motion having a translation component of motion in a main direction that corresponds to the direction of elongation of the supported elongated reflective wire and a translation component of motion in a first direction perpendicular to the main direction, wherein the supporting and driving structure further comprises:
- a pair of driving pulleys with grooves to engage and drive said elongated reflective wire,
- a driving spindle mounting each of the driving pulleys in an off-center manner, and
- a drive device for causing rotation of the driving pulleys so that they rotate eccentrically about each individual driving spindle to provide the elongated reflective wire with both the main direction component of motion and the first direction component of motion.
An apparatus for analyzing a laser beam incorporating a device for sampling a cross-section portion of the laser beam, said device comprising:
- an elongated reflective element;
- a supporting and driving structure operative to cause the movement of the elongated reflective element with a complex motion having a component of motion in a main direction that corresponds to the direction of elongation of the supported elongated reflective element and a component of motion in a first direction perpendicular to the main direction;
- and
- a system for analyzing a beam reflected by said elongated reflective element, wherein said reflected beam analyzing system further comprises:
- a slit diaphragm, and
- means for the displacement of the slit diaphragm in a translatory movement in a direction essentially perpendicular to a second direction along which the elongated reflective element reflects light.
An apparatus for analyzing a laser beam, comprising:
- a laser beam segment analyzing detector receiving a segment of the laser beam and converting it to a signal for analyzing;
- a laser beam analyzer to perform said analyzing;
- and
- a sampling device providing a sampled small segment of the laser beam to said analyzing detector, said sampling device comprising:
- an elongated reflective element;
- and
- a supporting and driving structure operative to cause the movement of the elongated reflective element with a complex motion having a component of motion in a main direction that corresponds to the direction of elongation of the supported elongated reflective element and with a component of motion in a first direction perpendicular to the main direction.
Dependencies are inferred from the claim text.