Silicon metal-semiconductor-metal photodetector
AssigneeSandia National Laboratories
InventorsSteven R. J. Brueck, David R. Myers, Ashwani K. Sharma
Life of this patent
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Abstract
Silicon MSM photodiodes sensitive to radiation in the visible to near infrared spectral range are produced by altering the absorption characteristics of crystalline Si by ion implantation. The implantation produces a defected region below the surface of the silicon with the highest concentration of defects at its base which acts to reduce the contribution of charge carriers formed below the defected layer. The charge carriers generated by the radiation in the upper regions of the defected layer are very quickly collected between biased Schottky barrier electrodes which form a metal-semiconductor-metal structure for the photodiode.
Claims2
A silicon-based photodiode having effective response to radiation in the visible to near infrared wavelengths comprising:
- a planar layer comprising crystalline Si having a defected layer within it produced by ion implantation extending into the Si layer below the surface of the Si layer exposed to the radiation wherein the defected layer has its highest concentration of defects in its deepest portion such that a region of relatively higher resistivity and containing a greater number of recombination centers is formed therein sufficient to reduce the collection at the electrodes of charge carriers produced below the defected layer;
- at least two Schottky barrier electrodes on the Si layer adjacent the defected layer;
- and means to sense the photodiode response to the radiation, said means being connected between the at least two electrodes.
A silicon-based metal-semiconductor-metal photodiode having effective response to radiation in the visible to near infrared wavelengths comprising:
- a planar layer comprising crystalline Si having a defected layer within it produced by ion implantation extending into the Si layer down to about 1.0 .mu.m below the surface of the Si layer exposed to the radiation wherein the defected layer has its highest concentration of defects in its deepest portion such that a region of relatively higher resistivity and containing a greater number of recombination centers is formed therein sufficient to reduce the collection at the electrodes of charge carriers produced below the defected layer;
- two interdigitated Schottky barrier electrodes on the Si layer adjacent the defected layer;
- and means to sense the photodiode response to the radiation, said means being connected between the at least two electrodes.
Dependencies are inferred from the claim text.