Method for mapping surfaces adapted for receiving electrical components
AssigneeInternational Business Machines Corporation
InventorsLewis S. Goldmann, Emanuele F. Lopergolo
Life of this patent
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Abstract
A method for mapping a surface adapted for receiving electrical components comprising the steps or providing a probe having a plurality of contacts, moving the probe toward the surface at a predetermined rate of speed, recording the time of all occurrences of contact between each of the probe contacts and the surface, determining the height of each portion of the surface contacted by one of the probe contacts, and correcting the height to account for non-planarity of the probe contacts.
Claims22
A method for mapping a surface adapted for receiving electrical components, comprising the steps of:
- a) providing a probe having a plurality of contacts;
- b) moving the probe toward the surface at a predetermined rate of speed;
- c) recording the time of all occurrences of contact between each of the probe contacts and the surface;
- d) determining the height of each portion of the surface contacted by one of the probe contacts;
- and
- e) correcting the height determined in step (d) to account for non-planarity of the probe contacts.
A method for mapping a surface adapted for receiving electrical components, comprising the steps of:
- a) providing a probe having a plurality of contacts;
- b) calibrating the probe to determine any degree of non-planarity of the probe contacts;
- c) moving the probe toward the surface at a first rate of speed;
- d) decreasing the rate of speed at which the probe is moving to a second rate of speed when the probe contacts reach a predetermined distance from the surface;
- e) recording the time when contact first occurs between at least one of the probe contacts and the surface;
- f) recording the time of all subsequent occurrences of contact between the probe contacts and the surface;
- g) determining the height of each portion of the surface contacted by one of the probe contacts;
- h) correcting each height determined in step (g) to account for non-planarity of the probe contacts;
- i) determining an ideal plane with which the surface may be compared;
- and
- j) correcting the height determined in step (h) to represent the distance from the ideal plane.
A method for mapping a surface adapted for receiving electrical components, comprising the steps of:
- a) providing a probe having a plurality of contacts;
- b) calibrating the probe to determine any degree of non-planarity of the probe contacts;
- c) moving the probe toward the surface at a first rate of speed;
- d) decreasing the rate of speed at which the probe is moving to a second rate of speed when the probe contacts reach a predetermined distance from the surface;
- e) recording the time when contact first occurs between at least one of the probe contacts and the surface;
- f) recording the time of all subsequent occurrences of contact between the probe contacts and the surface;
- g) determining the height of each portion of the surface contacted by one of the probe contacts, the height being the product of the time measured in step (f) and the first rate of speed;
- h) terminating recording step (f) upon the last occurrence of contact between a probe contact and the surface;
- i) correcting each height determined in step (g) to account for non-planarity of the probe contacts;
- j) determining an ideal plane with which the substrate surface may be compared;
- k) correcting the height determined in step (i) to represent the distance from the ideal plane;
- and
- l) determining whether the height determined in the correcting step (k) is within a predetermined range of heights.
Dependencies are inferred from the claim text.