Pellicle for protection of photolithographic mask
AssigneeShin-Etsu Chemical Co., Ltd.
InventorsYoshihiro Kubota, Meguru Kashida, Yoshihiko Nagata, Hitoshi Noguchi, Yuichi Hamada, Kimitaka Kumagae
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AssigneeShin-Etsu Chemical Co., Ltd.
InventorsYoshihiro Kubota, Meguru Kashida, Yoshihiko Nagata, Hitoshi Noguchi, Yuichi Hamada, Kimitaka Kumagae
Estimating the term…
Disclosed is a frame-supported pellicle for dust-proofing of a photolithographic photomask used for patteriwse light exposure in the manufacturing process of, for example, semiconductor devices, which comprises (a) a frame member, (b) a transparent polymeric film supported by the frame member and (c) a coating layer of a sticky adhesive on one surface of the polymeric film to capture any dust particles in the space between the photomask and the pellicle. The inventive pellicle is imparted with a greatly improved serviceable life with stability against ultraviolet irradiation relative to the adhesive coating layer which is formed from a specific organo-polysiloxane-based adhesive composition.
A frame-supported pellicle for dust-proofing of a photolithographic mask which comprises:
Dependencies are inferred from the claim text.