Ion milling end point detection method and apparatus
AssigneeInternational Business Machines Corporation
InventorsWilliam Harrington Brearley, Donald Charles Forslund, Douglas William Ormond, Jr., Gerald Joseph Sliss
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Abstract
An ion milling end point detection method for etching coated substrates is disclosed comprising the use of a light measurement of light passing through a monitor substrate (e.g., glass coated with the same material at about the same thickness as the coated substrate to be etched) during the milling process, comparing the light values with a reference value and determining the end point of the milling process based on said values. Coated and uncoated monitor substrates may also be employed together and the values compared to determine the end point. An apparatus for determining the end point of an ion milling process is also disclosed.
Claims19
An end point detection method for an ion milling process for etching coated substrates which process is performed in an ion milling apparatus wherein an ion source generates light and ions for milling and the ions bombard the coated substrates comprises positioning a light passing monitor substrate in the apparatus in substantially the same orientation as the coated substrates being etched, the monitor substrate comprising a light passing substrate having a coating on at least a position thereof of the same material as on the coated substrate, measuring the light passing through the light passing monitor substrate, comparing the measured light values passing through the monitor substrate during the process with a preset reference value or reference value based on the uncoated monitor substrate and determining the end point of the milling process based on said values.
A method for determining the endpoint of an ion milling process for etching coated substrates, said method comprising:
- positioning the coated substrates in a vacuum chamber;
- positioning in the vacuum chamber in substantially the same orientation as the coated substrate products at least one light passing monitor substrate comprising a light passing substrate having a coating on at least a portion thereon of the same material as on the coated substrate;
- positioning a light receiving lens within the chamber so that light passing through the monitor substrate is captured by the lens;
- flowing a reaction gas into the chamber;
- generating ions to etch the substrates and produce light which ions bombard the coated substrates and monitor substrate;
- measuring the light passing through the monitor substrate;
- and
- comparing the measured light value with a preset reference value or reference value based on the uncoated monitor substrate to determine the end point of the process.
An ion milling apparatus comprising:
- a vacuum chamber;
- inlet means for introducing an ionizable gas into the chamber;
- exhaust means for removing gases from the chamber;
- means for forming ionized gases in the chamber which ions produce light and which bombard coated substrates in the chamber;
- means for holding in substantially the same orientation in the chamber a plurality of coated substrate products to be etched and at least one light passing monitor substrate comprising a light passing substrate having a coating on at least a portion thereon of the same material as on the coated substrate;
- light transmitting means having first and second terminals said first terminal penetrating a wall of the chamber and said second terminal being positioned at a location outside said chamber;
- a lens attached to said first terminal and positioned to capture light passing through the monitor substrate;
- and
- measuring means connected to said second terminal to measure the light passing through the monitor substrate and to determine the amount of coating remaining on the monitor substrate based on the light measurement values and a preset reference value or reference value based on the uncoated monitor substrate.
Dependencies are inferred from the claim text.