X-ray examination apparatus comprising a beam diaphragm
AssigneeU.S. Philips Corporation
InventorFransiscus J. M. Van Den Besselaar
Life of this patent
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Abstract
An X-ray examination apparatus includes a beam diaphragm (3) with an X-ray absorbing shutter (4, 31, 32) which is arranged between the X-ray source (1) and the X-ray detector (9) in order to intercept parts of the X-ray beam (2), thus forming a limited X-ray beam (7). The shutter (4, 31, 32) can be displaced according to different degrees of freedom by different rotations of control rings (21, 22, 41, 42, 47, 48) whereto the shutter (4, 31, 32) is coupled. Because the shutter (4, 31, 32) can be moved to practically any desired position within the X-ray beam (2), the beam diaphragm (3) can shape the cross-section of the limited X-ray beam (7) in such a manner that essentially only a part (5) of a patient (6) to be examined is exposed to X-rays.
Claims8
An X-ray examination apparatus, comprising a beam diaphragm with a plurality of shutters and adjusting means coupled to the pair of shutters for varying a shutter aperture of the beam diaphragm comprising a plurality of control rings, said adjusting means being configured such that the plurality of shutters are mutually independently radially slidable and rotatable transversely of the central axis of the beam diaphragm and each of the shutters is adjusted by mutually independent rotation of a different associated two of said plurality of control rings, said mutually independent rotation of each different associated two of said plurality of control rings adjusting one and only one of said shutters.
Dependencies are inferred from the claim text.