Time interval measurement system and a method applied therein
AssigneeNEC Corporation
InventorHirokuni Murakami
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AssigneeNEC Corporation
InventorHirokuni Murakami
Estimating the term…
In order to measure an individual time interval with accuracy beyond frequency limit of semiconductors, a time measurement system of the invention generates a series of delayed pulses, each of which has the same pulse width with the time interval to be measured and delayed by a unit delay time shorter than a cycle time of a system clock from its preceding delayed pulse. A series of discriminate number measurement pulses are also generated from the series of delayed pulses, each of which rises at a common time and falls at each corresponding delay pulse. From number of a longest sequence of the same pulse number of the system clock counted in the discriminate number measurement pulses, the unit delay time is measured. From average value of pulse numbers of the system clock counted in each of the delayed pulses, the time interval to be measured is calculated with accuracy of the unit delay time.
A time interval measurement system comprising:
A time interval measurement system comprising:
A method of time interval measurement comprising steps of:
A method of time interval measurement comprising steps of:
Dependencies are inferred from the claim text.