Semiconductor memory device
AssigneeKabushiki Kaisha Toshiba
InventorsHiroaki Murakami, Yoshiyuki Tanaka
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AssigneeKabushiki Kaisha Toshiba
InventorsHiroaki Murakami, Yoshiyuki Tanaka
Estimating the term…
A NAND type EEPROM includes block selecting circuits (BSC1 to BSC6) configured to keep a defective block non-selected in the mode for simultaneous writing and simultaneous erasure of all blocks (BLK1-BLK4) to test the device, after the defective block is replaced by a redundant block (SBLK1, SBLK2). This prohibitor a high voltage boosted by a booster circuit for simultaneous writing and simultaneous erasure of all blocks from being applied to the defective block. The block selecting circuits output a "NON-SELECT" signal when a signal instructing simultaneous writing or simultaneous erasure of all blocks is supplied after corresponding fuses (fa-fh)are blown or cut off. Therefore, once a defective block is replaced by a redundant block, there never occurs a voltage drop which may otherwise be caused by leakage of current from the defective block, and the device can be used as a non-defective NAND type EEPROM in all modes including the test mode.
A semiconductor memory device comprising:
A semiconductor memory device comprising:
Dependencies are inferred from the claim text.