Scale pattern arrangement
AssigneeDataliner AB
InventorRudolf Wiklund
Life of this patent
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Abstract
A scale pattern is placed in close proximity of a measuring point whose position is to be determined in at least one dimension with the aid of a narrow measuring beam which moves in one place and sweeps over the scale pattern as it moves. The scale pattern is such that an indicating arrangement which indicates impingement of the measuring beam on the scale pattern gives rise to different signal patterns from a beam detector (25) for different heights at which the measuring beam sweeps over the scale pattern. The scale pattern has reflective and non-reflective pattern parts. Each scale pattern includes part-patterns (63, 64; 84, 85; 90, 91; 102, 105) which are operative in providing time or position scale-calibration for the signal pattern obtained from the beam detector (25) as the measuring beam sweeps over the scale pattern.
Claims9
A scale pattern device which is placed in a close vicinity to a measuring point whose position in at least one dimension is to be determined, said scale pattern device comprising:
- a longitudinal body across which a narrow measuring beam is moved in a plane to impinge and sweep across a width dimension thereof;
- a position pattern which is provided on said body and impinged by the beam, the impingement of the beam on said position pattern producing different signal patterns in an indicating device indicative of different beam positions along a length dimension of the body so that the position of the measuring point relative to beam position on said body in the one dimension can be determined;
- and
- a calibration pattern which is also provided on said body also impinged by the beam, the impingement of the beam on said calibration pattern producing a time or length scale calibration of the signal pattern obtained by the indicating device as the beam is swept across the position pattern.
Dependencies are inferred from the claim text.